Characterization of Surfaces and Interfaces
The microscopic methods available in the service lab (Atomic Force Microscopy [AFM], Environmental Scanning Electron Microscopy [SEM/ESEM], Transmission Electron Microscopy [TEM] and Light Microscopy [LM]) offer the possibility to characterize highly diversified material systems on the micro- and nanometer scale. These complementary methods enable to a comprehensive understanding of architectures and functions of material systems.
Fields of activity and research objectives
Surface Analysis and Surface Morphology of:
- Polymer networks,
- Thin organic films,
- Nanoparticles,
- Crystalline polymers,
- Surfaces with cells or bacteria,
- Biomaterials,
- Composite materials.
- Blends
- Determination of elasticity and viscosity properties by force modulation, by friction forces (lateral force mode) or by phase mode imaging.
Interfacial Structure and Bulk Morphology of:
- polymer blends and block copolymers,
- polymer composites,
- crystalline polymers,
- Latices / polymer dispersions,
- polymer networks (amphilphilic networks)
Services:
- Atomic Force Microscopy (AFM)
- Scanning electron microscopy (SEM) with elemental analysis (EDX)
- Scanning electron microscopy on wet aqueous samples (ESEM)
- Transmission electron microscopy (TEM)