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Characterization of Surfaces and Interfaces

The microscopic methods available in the service lab (Atomic Force Microscopy [AFM], Environmental Scanning Electron Microscopy [SEM/ESEM], Transmission Electron Microscopy [TEM] and Light Microscopy [LM]) offer the possibility to characterize highly diversified material systems on the micro- and nanometer scale. These complementary methods enable to a comprehensive understanding of architectures and functions of material systems.

Fields of activity and research objectives


Surface Analysis and Surface Morphology of:

  • Polymer networks,
  • Thin organic films,
  • Nanoparticles,
  • Crystalline polymers,
  • Surfaces with cells or bacteria,
  • Biomaterials,
  • Composite materials.
  • Blends
  • Determination of elasticity and viscosity properties by force modulation, by friction forces (lateral force mode) or by phase mode imaging.


Interfacial Structure and Bulk Morphology of:

  • polymer blends and block copolymers,
  • polymer composites,
  • crystalline polymers,
  • Latices / polymer dispersions,
  • polymer networks (amphilphilic networks)



  • Atomic Force Microscopy (AFM)
  • Scanning electron microscopy (SEM) with elemental analysis (EDX)
  • Scanning electron microscopy on wet aqueous samples (ESEM)
  • Transmission electron microscopy (TEM)